Zhao Feng Tao, Wang Li Ming, Li Wen Cai, Lin Xiao Hu, Li Xing Feng, Gao Ju Rong, Wang Hong Gang
Agronomy College of Shandong Agriculture University, Subcentre of National Wheat Improvement Center, Taian, 271018.
Shi Yan Sheng Wu Xue Bao. 2005 Apr;38(2):133-40.
6 alien disomic addition lines (line0605; line0607, line0609, line0610, line0611, line0625), which were selected from 59 wheat-Elytrigia intermedium hybridization germ plasm lines, were identified by using the methods of morphology, powdery mildew resistance identifications, cytology and RAPD analysis. Morphogy results showed that they all had the better agronomic characters of their parents; Cytogic results showed that the chromosome configuration at PMC M I was 2n = 22 II; 209 random primers were used for RAPD amplification, result showed 5 of them amplified the specific bands of Elytrigia intermedium parents of 6 disomic addition lines, which could be used as RAPD markers for alien addition chromosomes. Results of powdery mildew resistance showed that line0605 was immune, line0607 was intermediately resistant, line 0610 and line0625 were highly resistant, and line0609 and line0611 were intermediately sensitive.
从59个小麦-中间偃麦草杂交种质系中筛选出6个异源二体附加系(0605系、0607系、0609系、0610系、0611系、0625系),采用形态学、抗白粉病鉴定、细胞学和RAPD分析等方法对其进行鉴定。形态学结果表明,它们均具有双亲较好的农艺性状;细胞学结果表明,花粉母细胞减数分裂中期Ⅰ的染色体构型为2n = 22Ⅱ;用209个随机引物进行RAPD扩增,结果显示其中5个引物扩增出了6个二体附加系中间偃麦草亲本的特异带,可作为外源附加染色体的RAPD标记。抗白粉病结果表明,0605系免疫,0607系中抗,0610系和0625系高抗,0609系和0611系中感。