Kurahashi Masayasu, Mizutani Jun, Hioki Akiharu
National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, AIST Tsukuba 3-10, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan.
Anal Sci. 2005 Jul;21(7):827-32. doi: 10.2116/analsci.21.827.
A new reliable analytical method, "Monochromatic X-ray Excitation X-ray Fluorescence Spectrometry", has been proposed. For validating the method, trace elements in sediment certified reference materials were determined. In the method X-ray fluorescence spectra are measured for specimens and pure metals; in addition the mass-attenuation coefficients of the specimens for various X-ray wavelengths are also measured. The data are analyzed by the fundamental parameter method and the uncertainty of the analysis is evaluated. The obtained results were in satisfactory agreement with the certified values within their uncertainties. This method will be applicable to the certification of reference materials, in the field of which reliable results with uncertainty statements are required.
一种新的可靠分析方法——“单色X射线激发X射线荧光光谱法”已被提出。为验证该方法，对沉积物标准参考物质中的微量元素进行了测定。在该方法中，测量了样品和纯金属的X射线荧光光谱；此外，还测量了样品对各种X射线波长的质量衰减系数。通过基本参数法对数据进行分析，并评估分析的不确定度。所得结果在其不确定度范围内与认证值吻合良好。该方法将适用于参考物质的认证，在该领域需要具有不确定度声明的可靠结果。
