Suppr超能文献

通过X射线反射率表征固液界面的生物薄膜

Characterization of biological thin films at the solid-liquid interface by x-ray reflectivity.

作者信息

Miller C E, Majewski J, Gog T, Kuhl T L

机构信息

Biophysics Graduate Group, University of California, Davis, California 95616, USA.

出版信息

Phys Rev Lett. 2005 Jun 17;94(23):238104. doi: 10.1103/PhysRevLett.94.238104. Epub 2005 Jun 16.

Abstract

We demonstrate that 18 keV x-rays can be used to study organic thin films at the solid-liquid interface by x-ray reflectivity. We establish that this is a powerful technique for investigating biological systems in a previously inaccessible manner. Our measurements enabled the density distribution of single phospholipid bilayer membranes in bulk water to be measured with unprecedented precision. Previously, characterization of biomimetic structures normal to a "buried" interface was a domain of neutron reflectivity.

摘要

我们证明,18 keV的X射线可用于通过X射线反射率研究固液界面处的有机薄膜。我们证实,这是一种以先前无法实现的方式研究生物系统的强大技术。我们的测量能够以前所未有的精度测量大量水中单个磷脂双分子层膜的密度分布。以前,垂直于“埋藏”界面的仿生结构的表征是中子反射率的领域。

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验