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通过静电力显微镜研究二维PbSe纳米晶体阵列中的局部电荷传输。

Local charge transport in two-dimensional PbSe nanocrystal arrays studied by electrostatic force microscopy.

作者信息

Hu Zonghai, Fischbein Michael D, Drndić Marija

机构信息

Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA.

出版信息

Nano Lett. 2005 Jul;5(7):1463-8. doi: 10.1021/nl050828p.

Abstract

Two-dimensional PbSe nanocrystal arrays on silicon nitride membranes were investigated using electrostatic force microscopy (EFM) and transmission electron microscopy (TEM). Changes in lattice and transport properties upon annealing in a vacuum were revealed. Local charge transport behavior was directly imaged by EFM and correlated to nanopatterns observed with TEM. Charge transport through nanochannels in complex two-dimensional nanocrystal networks was identified. Our results demonstrate the importance of measurements of local transport details complementary to the conventional current-voltage (I-V) measurements.

摘要

利用静电力显微镜(EFM)和透射电子显微镜(TEM)对氮化硅膜上的二维PbSe纳米晶体阵列进行了研究。揭示了在真空中退火后晶格和输运性质的变化。通过EFM直接成像局部电荷输运行为,并与TEM观察到的纳米图案相关联。确定了通过复杂二维纳米晶体网络中的纳米通道的电荷输运。我们的结果证明了测量与传统电流-电压(I-V)测量互补的局部输运细节的重要性。

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