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In situ high-energy x-ray diffraction study of the local structure of supercooled liquid Si.

作者信息

Kim T H, Lee G W, Sieve B, Gangopadhyay A K, Hyers R W, Rathz T J, Rogers J R, Robinson D S, Kelton K F, Goldman A I

机构信息

Department of Physics, Washington University, St. Louis, Missouri 63130, USA.

出版信息

Phys Rev Lett. 2005 Aug 19;95(8):085501. doi: 10.1103/PhysRevLett.95.085501. Epub 2005 Aug 17.

DOI:10.1103/PhysRevLett.95.085501
PMID:16196868
Abstract

Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.

摘要

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