Ismail-Beigi Sohrab, Louie Steven G
Department of Applied Physics, Yale University, New Haven, Connecticut 06520, USA.
Phys Rev Lett. 2005 Oct 7;95(15):156401. doi: 10.1103/PhysRevLett.95.156401. Epub 2005 Oct 6.
Irradiating silica produces self-trapped excitons (STEs) that spontaneously create atomic-scale distortions on which they localize themselves. Despite enduring interest in STEs and subsequent defects in this key technological material, the trapping mechanism and geometry remain a mystery. Our ab initio study of STEs in alpha-quartz using a many-electron Green's function approach answers both questions. The STE comprises a broken O-Si bond with the hole localized on the defected oxygen and the electron on the defected silicon atom in a planar sp2 conformation. The results further explain quantitatively the measured STE spectra.
对二氧化硅进行辐照会产生自陷激子(STE),这些自陷激子会自发地产生原子尺度的畸变,并将自身定位在这些畸变上。尽管人们一直对这种关键技术材料中的自陷激子及其后续缺陷感兴趣,但捕获机制和几何结构仍然是个谜。我们使用多电子格林函数方法对α-石英中的自陷激子进行的从头算研究回答了这两个问题。自陷激子由一个断裂的O-Si键组成,空穴位于缺陷氧上,电子位于缺陷硅原子上,呈平面sp2构型。这些结果进一步定量解释了测量到的自陷激子光谱。