Izmailov Chingiz A, Sokolov Evgeni N, Korshunova Svetlana G
Moscow State University.
Span J Psychol. 2005 Nov;8(2):119-33. doi: 10.1017/s1138741600005023.
This study researches the input of the cerebral occipital and temporal cortex in the analysis of facial configuration and expressive characteristics. Analysis is based on the construction of a spherical model for the differentiation of schematically presented faces with quantitatively altering curvature of the mouth and brows. The model is designed using the method of multidimensional scaling of the dissimilarity judgments between stimuli (faces) and the amplitude of evoked potentials of differences (EPD) between abrupt stimulus changes recorded from the occipital and posterior temporal cortex. Analysis of the structure of the spherical model of facial differentiation depending on the electrode site and the latency of the EPD component within the duration of 120-240 ms has demonstrated that the activity of the occipital and posterior temporal cortex of the right hemisphere is associated with the emotional characteristics of the presented face, whereas facial configuration is reflected in the activation of both posterior temporal cortex and the occipital cortex of the left hemisphere. At all electrode sites maximum information of the emotional expression and configuration is represented in inter-peak amplitude P120-N180. With increasing latency there is increased distortion of the structure of differences in the spherical model of schematically presented faces, which is interpreted as an attenuation of electrical activity associated with the analysis of the emotional expression, which occurs more rapidly than configuration analysis.
本研究探讨大脑枕叶和颞叶皮质在面部形态及表情特征分析中的作用。分析基于构建一个球形模型,该模型用于区分示意性呈现的面部,这些面部的嘴部和眉毛曲率会进行定量变化。该模型采用刺激物(面部)之间差异判断的多维缩放方法以及从枕叶和颞叶后部皮质记录的突然刺激变化之间差异诱发电位(EPD)的幅度来设计。对依赖于电极位置以及EPD成分在120 - 240毫秒持续时间内潜伏期的面部区分球形模型结构的分析表明,右半球枕叶和颞叶后部皮质的活动与所呈现面部的情感特征相关,而面部形态则反映在左半球颞叶后部皮质和枕叶皮质的激活上。在所有电极位置,情感表达和形态的最大信息都体现在峰间振幅P120 - N180中。随着潜伏期增加,示意性呈现面部球形模型中差异结构的扭曲增加,这被解释为与情感表达分析相关的电活动衰减,其发生速度比形态分析更快。