Fuhse Christian, Ollinger Christoph, Kalbfleisch Sebastian, Salditt Tim
Institut für Röntgenphysik, Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany.
J Synchrotron Radiat. 2006 Jan;13(Pt 1):69-73. doi: 10.1107/S0909049505038008. Epub 2005 Dec 22.
The far-field diffraction pattern of a front-coupled planar waveguide supporting two guided modes has been measured using a white X-ray beam. Interference of the guided modes leads to a characteristic variation of the far-field diffraction pattern for different photon energies. The experiment verifies the predicted properties of the guided modes, shows that these modes superpose coherently, and demonstrates that the electromagnetic field downstream of the waveguide is significantly different from that expected for a hypothetical small slit of the same size.
利用白色X射线束测量了支持两种导模的前耦合平面波导的远场衍射图样。导模的干涉导致远场衍射图样随不同光子能量呈现出特征性变化。该实验验证了导模的预测特性,表明这些模式相干叠加,并证明了波导下游的电磁场与相同尺寸的假想小狭缝所预期的电磁场有显著差异。