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通过聚合物刷与聚乙烯吡咯烷酮的氢键组装制备的复合薄膜。

Composite thin film by hydrogen-bonding assembly of polymer brush and poly(vinylpyrrolidone).

作者信息

Yang Shuguang, Zhang Yongjun, Wang Li, Hong Song, Xu Jian, Chen Yongming, Li Chengming

机构信息

State Key Laboratory of Polymer Physics and Chemistry, Institute of Chemistry, Chinese Academy of Sciences, Beijing 100080, China.

出版信息

Langmuir. 2006 Jan 3;22(1):338-43. doi: 10.1021/la051581e.

Abstract

Based on hydrogen-bonding layer-by-layer (LBL) assembly in aqueous solution, poly(vinylpyrrolidone) (PVPON) and a spherical polymer brush with a poly(methylsilsesquioxane) (PSQ) core and poly(acrylic acid) (PAA) hair chains were used to fabricate composite multilayer thin films. Hydrogen bonding as the driving force was confirmed by FT-IR spectrometry. A simple method (Filmetric F20) was introduced to determine the thickness and refractive index of the films. The film thickness was found to be a linear function of the number of bilayers. The average increase in thickness per bilayer is 28.3 nm. The film morphology was characterized with scanning electron microscopy and atomic force microscopy. The images obtained from the two instruments show a great resemblance. The films were further calcined to get an inorganic film by removing the organic components, or treated with tetrabutylammonium fluoride (TBAF) to remove the PSQ core and get an organic film. The optical properties and morphological changes induced by these treatments were also studied.

摘要

基于水溶液中的氢键逐层(LBL)组装,使用聚乙烯吡咯烷酮(PVPON)以及具有聚甲基倍半硅氧烷(PSQ)核和聚丙烯酸(PAA)侧链的球形聚合物刷制备复合多层薄膜。通过傅里叶变换红外光谱法确认氢键为驱动力。引入了一种简单的方法(Filmetric F20)来测定薄膜的厚度和折射率。发现膜厚是双层数的线性函数。每层双层的平均厚度增加为28.3 nm。用扫描电子显微镜和原子力显微镜对膜形态进行表征。从这两种仪器获得的图像显示出高度相似性。通过去除有机成分进一步煅烧薄膜以获得无机膜,或用四丁基氟化铵(TBAF)处理以去除PSQ核并获得有机膜。还研究了这些处理引起的光学性质和形态变化。

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