Kröger H, Reinke P, Büttner M, Oelhafen P
II. Physikalisches Institut, Universität Göttingen, Germany.
J Chem Phys. 2005 Sep 15;123(11):114706. doi: 10.1063/1.2018838.
The growth of Au clusters on a fullerene thin film was investigated by in situ photoelectron spectroscopy in the ultraviolet (UPS) and x-ray (XPS) regime. Due to its highly corrugated surface fullerene films provide a wide range of bonding sites which could be exploited as molecular templates and serve to create a cluster superstructure. To gain insight into the fullerene-Au interaction two types of experiments were performed: (i) the deposition of Au on a fullerene surface, and (ii) the deposition of fullerenes on a Au surface. In both experiments an island growth mode is observed. The deposition of submonolayer amounts of C60 onto a gold film showed that the main interaction of the two species is due to chemisorption of the first C60 monolayer. In addition a constant band bending in the fullerene film is detected, but the UPS valence-band spectra show that there is no charge transfer from the Au to the C60 lowest unoccupied molecular orbital. In the reverse experiment, the cluster growth of Au on the corrugated C60 surface, the analysis of the Au core level does not reveal a specific bonding or nucleation site for Au atoms and clusters. This is in contrast to observations with Si clusters, which prefer to reside in the troughs between the fullerene molecules. The Au clusters grow continually from a size of about 55 atoms for the early stages of growth up to 150 atoms for the deposition of a nominal coverage of 1.5 nm. These data are derived from an analysis of the d-band splitting and the Au 4f core-level shift due to delayed photohole relaxation. The thermal stability of the Au-clusters-covered fullerene film was investigated by annealing in situ up to temperatures of 650 degrees C. For temperatures up to 450 degrees C a continuous growth of the clusters is detected, which is accompanied by a slight drop in Au concentration in the range of XPS for annealing temperatures higher than 350 degrees C. This may be due to a ripening of the clusters. The presence of Au apparently delays fullerene sublimation. The film shows a very good thermal stability and even after annealing at 650 degrees C there is still a fullerene film detectable in the photoelectron spectroscopy spectra.
通过紫外光电子能谱(UPS)和X射线光电子能谱(XPS)原位研究了富勒烯薄膜上金团簇的生长。由于其高度起伏的表面,富勒烯薄膜提供了广泛的键合位点,这些位点可作为分子模板,并用于创建团簇超结构。为了深入了解富勒烯与金之间的相互作用,进行了两种类型的实验:(i)在富勒烯表面沉积金,以及(ii)在金表面沉积富勒烯。在这两个实验中均观察到岛状生长模式。将亚单层量的C60沉积到金膜上表明,这两种物质的主要相互作用是由于第一个C60单分子层的化学吸附。此外,检测到富勒烯薄膜中存在恒定的能带弯曲,但UPS价带光谱表明没有电荷从金转移到C60的最低未占据分子轨道。在反向实验中,即在起伏的C60表面上金的团簇生长,对金芯能级的分析未揭示金原子和团簇的特定键合或成核位点。这与硅团簇的观察结果形成对比,硅团簇倾向于位于富勒烯分子之间的凹槽中。金团簇在生长早期从约55个原子的尺寸持续生长,直至沉积标称覆盖度为1.5 nm时达到150个原子。这些数据来自对由于延迟光空穴弛豫导致的d带分裂和Au 4f芯能级位移的分析。通过原位退火至650℃研究了金团簇覆盖的富勒烯薄膜的热稳定性。对于高达450℃的温度,检测到团簇的持续生长,对于高于350℃的退火温度,在XPS范围内金浓度略有下降。这可能是由于团簇的熟化。金的存在显然延迟了富勒烯的升华。该薄膜显示出非常好的热稳定性,即使在650℃退火后,在光电子能谱中仍可检测到富勒烯薄膜。