Winter R, Nixon P G, Gard G L, Graham D J, Castner D G, Holcomb N R, Grainger D W
Department of Chemistry, Portland State University, Portland, Oregon 97201, USA.
Langmuir. 2004 Jul 6;20(14):5776-81. doi: 10.1021/la040011w.
Recently synthesized (Winter, R.; Nixon, P. G.; Gard, G. L.; Radford, D. H.; Holcomb, N. R.; Grainger, D. W. J. Fluorine Chem. 2001, 107, 23-30) SF5-terminated perfluoroalkyl thiols (SF5(CF2)nCH2CH2SH, where n = 2, 4, and 6) and a symmetric SF5-terminated dialkyl disulfide ([SF5-CH=CH-(CH2)8-S-]2) were assembled as thin films chemisorbed onto gold surfaces. The adsorbed monolayer films of these SF5-containing molecules on polycrystalline gold were compared using ellipsometry, contact angle, X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), and infrared spectroscopy (FTIR) surface analytical methods. The resulting SF5-dialkyl disulfide monolayer film shows moderate angle dependence in depth-dependent XPS analysis, suggesting a preferentially oriented film. The SF5-terminated perfluoroalkyl thiols exhibit angular-dependent XPS compositional variance depending on perfluoroalkyl chain length, consistent with improved film assembly (increasingly hydrophobic, fewer defects, and more vertical chain orientation increasing film thickness) with increasing chain length. Tof-SIMS measurements indicate that both full parent ions for these film-forming molecules and the unique SF5 terminal group are readily detectable from the thin films without substantial contamination from other adsorbates.
最近合成的(温特,R.;尼克松,P.G.;加德,G.L.;拉德福德,D.H.;霍尔科姆,N.R.;格兰杰,D.W.《氟化学杂志》2001年,107卷,23 - 30页)五氟化硫封端的全氟烷基硫醇(SF5(CF2)nCH2CH2SH,其中n = 2、4和6)以及一种对称的五氟化硫封端的二烷基二硫化物([SF5-CH=CH-(CH2)8-S-]2)被组装成化学吸附在金表面的薄膜。使用椭偏仪、接触角、X射线光电子能谱(XPS)、飞行时间二次离子质谱(ToF - SIMS)和红外光谱(FTIR)表面分析方法对这些含五氟化硫分子在多晶金上吸附的单层膜进行了比较。所得的五氟化硫 - 二烷基二硫化物单层膜在深度相关的XPS分析中显示出适度的角度依赖性,表明是一种优先取向的膜。五氟化硫封端的全氟烷基硫醇根据全氟烷基链长表现出角度依赖性的XPS组成变化,这与随着链长增加膜组装得到改善(疏水性增强、缺陷减少以及链取向更垂直,膜厚度增加)是一致的。ToF - SIMS测量表明,这些成膜分子的完整母离子以及独特的五氟化硫端基都能很容易地从薄膜中检测到,而没有来自其他吸附物的大量污染。