Banerjee Sarbajit, Jia Shengguo, Kim Dae I, Robinson Richard D, Kysar Jeffrey W, Bevk Joze, Herman Irving P
Materials Research Science and Engineering Center, Columbia University, New York, New York 10027, USA.
Nano Lett. 2006 Feb;6(2):175-80. doi: 10.1021/nl051921g.
The mechanical stability of nanocrystal films is critical for applications, yet largely unexplored. Raman microprobe analysis used here to probe the nanocrystal cores of thick, fractured electrophoretically deposited films of 3.2 nm diameter CdSe nanocrystals measures approximately 2.5% in-plane tensile strain in cores of unfractured films. The crack dimensions determine the overall in-plane film strain, approximately 11.7%, and the film biaxial modulus, approximately 13.8 GPa, from which the biaxial modulus of the trioctylphosphine oxide ligand matrix is inferred, approximately 5.1 GPa.
纳米晶体薄膜的机械稳定性对其应用至关重要，但在很大程度上尚未得到充分探索。本文使用拉曼微探针分析来探测直径为3.2 nm的CdSe纳米晶体的厚的、断裂的电泳沉积薄膜的纳米晶体核心，测量到未断裂薄膜核心中的面内拉伸应变约为2.5%。裂纹尺寸决定了薄膜的整体面内应变，约为11.7%，以及薄膜的双轴模量，约为13.8 GPa，由此推断出三辛基氧化膦配体基质的双轴模量约为5.1 GPa。
