Wang Y, Rafailovich M, Sokolov J, Gersappe D, Araki T, Zou Y, Kilcoyne A D L, Ade H, Marom G, Lustiger A
Department of Materials Science and Engineering, SUNY at Stony Brook, Stony Brook, New York 11794-2275, USA.
Phys Rev Lett. 2006 Jan 20;96(2):028303. doi: 10.1103/PhysRevLett.96.028303. Epub 2006 Jan 17.
Strong dependence of the crystal orientation, morphology, and melting temperature (Tm) on the substrate is observed in the semicrystalline polyethylene thin films. The Tm decreases with the film thickness decrease when the film is thinner than a certain critical thickness, and the magnitude of the depression increases with increasing surface interaction. We attribute the large Tm depression to the decrease in the overall free energy on melting, which is caused by the substrate attraction force to the chains that competes against the interchain force which drives the chains to crystallization.
在半结晶聚乙烯薄膜中观察到晶体取向、形态和熔点(Tm)对基底有强烈的依赖性。当薄膜厚度小于某一临界厚度时,Tm随薄膜厚度的减小而降低,且这种降低的幅度随着表面相互作用的增加而增大。我们将较大的Tm降低归因于熔化时总自由能的降低,这是由基底对链的吸引力与驱使链结晶的链间力相互竞争所导致的。