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碳化硅晶须的各向异性蚀刻

Anisotropic etching of SiC whiskers.

作者信息

Cambaz Goknur Z, Yushin Gleb N, Gogotsi Yury, Lutsenko Vadim G

机构信息

Department of Materials Science and Engineering, Drexel University, 3141 Chestnut Street Lebow Building, Room 344, Philadelphia, Pennsylvania 19104, USA.

出版信息

Nano Lett. 2006 Mar;6(3):548-51. doi: 10.1021/nl051858v.

Abstract

We have demonstrated a method of producing nanoplatelets or complex well-ordered nanostructures from silicon carbide (SiC) whiskers. Preferential etching of SiC whiskers in a mixture of hydrofluoric and nitric acids (3:1 ratio) at 100 degrees C results in the selective removal of cubic SiC and the formation of complex structures resembling a pagoda architecture. Possible mechanisms governing selective etching are discussed. Reproducible results on SiC whiskers manufactured in different laboratories suggest that the self-patterning phenomena are common in SiC whiskers, and the same electroless etching procedure can be used to synthesize various complex nanostructures from more conventional nano- and microscale objects for use as building blocks in the fabrication of sensors, cellular probes, and electronic, optoelectronic, electromechanical, and other devices.

摘要

我们已经展示了一种从碳化硅(SiC)晶须制备纳米片或复杂有序纳米结构的方法。在100摄氏度下,将SiC晶须在氢氟酸和硝酸的混合物(比例为3:1)中进行择优蚀刻,会导致立方SiC的选择性去除,并形成类似宝塔结构的复杂结构。文中讨论了控制选择性蚀刻的可能机制。在不同实验室制造的SiC晶须上获得的可重复结果表明,自图案化现象在SiC晶须中很常见,并且相同的化学蚀刻程序可用于从更传统的纳米和微米级物体合成各种复杂的纳米结构,以用作制造传感器、细胞探针以及电子、光电子、机电和其他设备的构建块。

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