Lee J I, Lee D, Kim J L, Chang S Y
Health Physics Department, Korea Atomic Energy Research Institute, P.O. Box 105, Yuseong, Daejeon, Korea.
Radiat Prot Dosimetry. 2006;119(1-4):293-9. doi: 10.1093/rpd/nci602. Epub 2006 Apr 27.
The thermoluminescence (TL) emission spectra from LiF TL materials, called KLT-300 (LiF:Mg,Cu,Na,Si) with various dopant concentrations are measured and analysed. These KLT-300 materials were developed by the Korea Atomic Energy Research Institute (KAERI) to achieve an enhancement of the thermal stability in TL readings. Six types of samples are prepared with different dopant concentrations in the following ranges; Mg (0-0.20 mol%), Cu (0-0.05 mol%), Na and Si (0-0.9 mol%). The spectra measurements are carried out for the six types of samples using a TL emission spectra measurement device. The spectra measurement device consists of a monochromator, photomultiplier tube and temperature control unit to thermally stimulate the samples. The measured data shows the light emission during heating of the sample as a function of temperature and wavelength (three-dimensional TL spectra). The spectra were analysed using a method of deconvolution based on gaussian curve. The wavelength of a main peak of the emission spectra changes depending on the existence of the Cu dopant, while intensity of the spectra rapidly changes with the Cu dopant concentrations. The 385 nm emission is mainly observed in all the spectra from the samples with the Cu dopant, but in those from the samples without the Cu dopant a very weak 401 nm emission is mainly observed. However, any change in the wavelength at a main peak of the TL emission spectra from the sample materials with Na and Si dopants is not observed but that in the intensity at a peak of the spectra is observed.
对不同掺杂浓度的名为KLT - 300(LiF:Mg,Cu,Na,Si)的氟化锂热释光(TL)材料的热释光发射光谱进行了测量和分析。这些KLT - 300材料由韩国原子能研究所(KAERI)研发,以提高热释光读数中的热稳定性。制备了六种不同掺杂浓度的样品,掺杂浓度范围如下:Mg(0 - 0.20摩尔%)、Cu(0 - 0.05摩尔%)、Na和Si(0 - 0.9摩尔%)。使用热释光发射光谱测量装置对这六种样品进行光谱测量。该光谱测量装置由一个单色仪、光电倍增管和用于热刺激样品的温度控制单元组成。测量数据显示了样品加热过程中的发光情况,它是温度和波长的函数(三维热释光光谱)。使用基于高斯曲线的去卷积方法对光谱进行分析。发射光谱主峰的波长根据Cu掺杂剂的存在而变化,而光谱强度随Cu掺杂剂浓度迅速变化。在含Cu掺杂剂的样品的所有光谱中主要观察到385 nm发射,但在不含Cu掺杂剂的样品的光谱中主要观察到非常微弱的401 nm发射。然而,未观察到含Na和Si掺杂剂的样品材料的热释光发射光谱主峰波长有任何变化,但观察到了光谱峰值强度的变化。