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用于光学偏置光子计数统计的扩展光子计数直方图和荧光强度分布分析方法。

Extended photon counting histogram and fluorescence intensity distribution analysis approaches for optically biased photon counting statistics.

作者信息

Meng Fanbo, Ma Hui

机构信息

Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China.

出版信息

J Phys Chem B. 2006 May 18;110(19):9667-73. doi: 10.1021/jp057055d.

Abstract

A gradient potential induced by a strongly focused laser beam can perturb the diffusion dynamics of particles in solutions and result in biased photon counting statistics in fluorescence fluctuation spectroscopy (FFS). In this paper, the theories of the photon counting histogram (PCH) and fluorescence intensity distribution analysis (FIDA) approaches are extended independently to fit the biased experimental data and retrieve the unbiased parameters, i.e., the average number of the sample particles in the focal volume N, their brightness epsilon, and polarizability alpha. The extended theories are tested using Monte Carlo simulations for single- and double-component systems. It is also proved numerically and analytically that the extended PCH and FIDA approaches are completely equivalent. Practical implementations and possible applications of extended PCH and FIDA are discussed.

摘要

由强聚焦激光束诱导的梯度势会扰乱溶液中粒子的扩散动力学,并导致荧光涨落光谱(FFS)中的光子计数统计出现偏差。本文分别扩展了光子计数直方图(PCH)和荧光强度分布分析(FIDA)方法的理论,以拟合有偏差的实验数据并获取无偏差参数,即焦体积内样品粒子的平均数量N、它们的亮度ε和极化率α。使用单组分和双组分系统的蒙特卡罗模拟对扩展理论进行了测试。还通过数值和解析证明了扩展的PCH和FIDA方法是完全等效的。讨论了扩展PCH和FIDA的实际实现和可能的应用。

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