Poulsen H F, Garbe S, Lorentzen T, Juul Jensen D, Poulsen F W, Andersen N H, Frello T, Feidenhans'l R, Graafsma H
Materials Department, Ris~ National Laboratory, DK-4000 Roskilde, Denmark.
J Synchrotron Radiat. 1997 May 1;4(Pt 3):147-54. doi: 10.1107/S0909049597002021.
The large penetration power of high-energy X-rays (>60 keV) raises interesting prospects for new types of structural characterizations of polycrystalline materials. It becomes possible in a non-destructive manner to perform local studies, within the bulk of the material, of the fundamental materials physics properties: grain orientations, strain, dislocation densities etc. In favourable cases these properties may be mapped in three dimensions with a spatial resolution that matches the dimensions of the individual grains. Imbedded volumes and interfaces become accessible. Moreover, the high energies allow better in-situ studies of samples in complicated environments (industrial process optimization). General techniques for research in this energy range have been developed using broad-band angle-dispersive methods, on-line two-dimensional detectors and conical slits. Characterizations have been made at the level of the individual grains and grain boundaries as well as on ensembles of grains. The spatial resolution is presently of the order of 10-100 micom. Four examples of applications are presented along with an outlook.
高能X射线（>60 keV）的高穿透能力为多晶材料新型结构表征带来了有趣的前景。以非破坏性方式对材料内部的基本材料物理性质进行局部研究成为可能，这些性质包括晶粒取向、应变、位错密度等。在有利的情况下，这些性质可以在三维空间中绘制出来，其空间分辨率与单个晶粒的尺寸相匹配。嵌入的体积和界面变得可及。此外，高能量使得在复杂环境中对样品进行更好的原位研究（工业过程优化）成为可能。在这个能量范围内的研究通用技术已经通过宽带角散射方法、在线二维探测器和锥形狭缝得以发展。已经在单个晶粒和晶界以及晶粒集合体层面进行了表征。目前的空间分辨率约为10 - 100微米。文中给出了四个应用实例以及展望。
