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Near-field reflection backscattering apertureless optical microscopy: application to spectroscopy experiments on opaque samples, comparison between lock-in and digital photon counting detection techniques.

作者信息

Diziain S, Bijeon J-L, Adam P-M, Lamy de la Chapelle M, Thomas B, Déturche R, Royer P

机构信息

Institut Charles Delaunay, CNRS FRE 2848, Laboratoire de Nanotechnologie et d'Instrumentation Optique, Université de technologie de Troyes, 12 rue Marie Curie, BP 2060, 10010 Troyes cedex, France.

出版信息

Ultramicroscopy. 2007 Jan;107(1):16-24. doi: 10.1016/j.ultramic.2006.04.009. Epub 2006 May 12.

DOI:10.1016/j.ultramic.2006.04.009
PMID:16735090
Abstract

An apertureless scanning near-field optical microscope (ASNOM) in reflection backscattering configuration is designed to conduct spectroscopic experiments on opaque samples constituted of latex beads. The ASNOM proposed takes advantage of the depth-discrimination properties of confocal microscopes to efficiently extract the near-field optical signal. Given their importance in a spectroscopic experiment, we systematically compare the lock-in and synchronous photon counting detection methods. Some results of Rayleigh's scattering in the near field of the test samples are used to illustrate the possibilities of this technique for reflection backscattering spectroscopy.

摘要

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