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电子束辐照对感染镰刀菌的制麦大麦安全性和品质的影响

Effect of electron-beam irradiation on the safety and quality of Fusarium-infected malting barley.

作者信息

Kottapalli Balasubrahmanyam, Wolf-Hall Charlene E, Schwarz Paul

机构信息

Department of Veterinary and Microbiological Sciences, 1523 Centennial Blvd., 114A Van Es Hall, North Dakota State University, Fargo, ND 58015, United States.

出版信息

Int J Food Microbiol. 2006 Aug 1;110(3):224-31. doi: 10.1016/j.ijfoodmicro.2006.04.007. Epub 2006 Jun 15.

Abstract

Utilization of Fusarium-infected barley for malting may lead to mycotoxin production during malting and decreased malt quality. Electron-beam irradiation may prevent safety and quality defects and allow use of otherwise good quality barley. We evaluated electron-beam irradiation for preventing Fusarium growth and mycotoxin production while maintaining barley-malt quality characteristics. Four barley lots with varying deoxynivalenol (DON) concentrations were irradiated at 0, 2, 4, 6, 8, and 10 kGy. Treated barley was malted in a pilot-scale malting unit. Barley and malt were analyzed for Fusarium infection (FI), germinative energy (GE), aerobic plate counts (APC), mold and yeast counts (MYC), and DON. Malt quality parameters included malt extract, soluble protein, wort color, wort viscosity, free amino nitrogen, alpha-amylase, and diastatic power. FI, APC, and MYC decreased in barley with an increase in dosage. The APC and MYC for malts from barley exposed to 8-10 kGy were slightly higher than in other malted samples indicating that irradiation-resistant microflora could flourish during malting. Barley GE significantly decreased (3-15%) at 8-10 kGy. Although irradiation had no effect on DON in raw barley, DON decreased significantly (60-100%) in finished malts prepared from treated barley (6-10 kGy). Malt quality parameters were slightly affected by electron-beam radiation. The results suggest 6-8 kGy may be effective for reducing FI in barley and DON in malt with minimal effects on malt quality.

摘要

使用受镰刀菌感染的大麦进行制麦芽可能会导致制麦芽过程中产生霉菌毒素并降低麦芽品质。电子束辐照可以预防安全和质量缺陷,并允许使用原本品质良好的大麦。我们评估了电子束辐照在维持大麦-麦芽品质特性的同时防止镰刀菌生长和霉菌毒素产生的效果。对四个脱氧雪腐镰刀菌烯醇(DON)浓度不同的大麦批次分别进行0、2、4、6、8和10千戈瑞的辐照。将处理后的大麦在中试规模的制麦芽装置中进行制麦芽。对大麦和麦芽进行镰刀菌感染(FI)、发芽势(GE)、需氧平板计数(APC)、霉菌和酵母菌计数(MYC)以及DON分析。麦芽品质参数包括麦芽浸出物、可溶性蛋白、麦芽汁颜色、麦芽汁粘度、游离氨基氮、α-淀粉酶和糖化力。随着辐照剂量增加,大麦中的FI、APC和MYC降低。暴露于8 - 10千戈瑞辐照的大麦制成的麦芽的APC和MYC略高于其他制麦芽样品,这表明抗辐照微生物群在制麦芽过程中可能会大量繁殖。在8 - 10千戈瑞时,大麦GE显著降低(3 - 15%)。虽然辐照对未加工大麦中的DON没有影响,但用处理过的大麦(6 - 10千戈瑞)制备的成品麦芽中的DON显著降低(60 - 100%)。麦芽品质参数受到电子束辐照的影响较小。结果表明,6 - 8千戈瑞可能有效地降低大麦中的FI和麦芽中的DON,同时对麦芽品质的影响最小。

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