Aoto Tomohiro, Ito Kenji, Hikosaka Yasumasa, Shibasaki Akihiro, Hirayama Ryo, Yamamono Norifumi, Miyoshi Eisaku
Photon Factory, Institute of Materials Structure Science, Tsukuba, Ibaraki 305-0801, Japan.
J Chem Phys. 2006 Jun 21;124(23):234306. doi: 10.1063/1.2206586.
The N2(+) states lying in the ionization region of 26-45 eV and the dissociation dynamics are investigated by high-resolution threshold photoelectron spectroscopy and threshold photoelectron-photoion coincidence spectroscopy. The threshold photoelectron spectrum exhibits several broad bands as well as sharp peaks. The band features are assigned to the N2(+) states associated with the removal of an inner-valence electron, by a comparison with a configuration interaction calculation. In contrast, most of the sharp peaks on the threshold photoelectron spectrum are allocated to ionic Rydberg states converging to N2(2+). Dissociation products formed from the inner-valence N2(+) states are determined by threshold photoelectron-photoion coincidence spectroscopy. The dissociation dynamics of the inner-valence ionic states is discussed with reference to the potential energy curves calculated.
利用高分辨率阈值光电子能谱和阈值光电子-光离子符合光谱，研究了处于26 - 45 eV电离区域的N2(+)态及其解离动力学。阈值光电子能谱呈现出几个宽峰以及尖锐的峰。通过与组态相互作用计算结果相比较，将宽峰特征归因于与移除一个内层价电子相关的N2(+)态。相比之下，阈值光电子能谱上的大多数尖锐峰被归为收敛到N2(2+)的离子里德堡态。由内层价N2(+)态形成的解离产物通过阈值光电子-光离子符合光谱来确定。结合计算得到的势能曲线，讨论了内层价离子态的解离动力学。
