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Structural characterization of nickel oxide nanowires by X-ray absorption near-edge structure spectroscopy.

作者信息

Wu Z Y, Liu C M, Guo L, Hu R, Abbas M I, Hu T D, Xu H B

机构信息

Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China.

出版信息

J Phys Chem B. 2005 Feb 24;109(7):2512-5. doi: 10.1021/jp0466183.

DOI:10.1021/jp0466183
PMID:16851250
Abstract

Nickel oxide nanowires modified by poly(vinylpyrrolidone) (PVP) were synthesized via a simple chemical pattern. For the first time NiO nanowires with diameters ranging from 40 to 100 nm with the expected ratio (length vs diameter) ranging from 54 to 90 were grown using a simple solution-phase approach (mild method). These nickel nanowires exhibited unique photoluminescence features and displayed a significant UV luminescence. X-ray absorption near-edge spectroscopy has been used to characterize the local Ni environment and identify the electronic structure. Comparing experimental and theoretical spectra at the Ni and O K edges, we determine the lattice distortion via the analysis of the characteristic preedge features and the multiple-scattering structures detected in the X-ray absorption near-edge structure spectra. The correlation between experimental features and the disordered or distorted local structures is also discussed.

摘要

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