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β-方石英(100)表面原子氧和氮的吸附:密度泛函理论研究

Adsorption of atomic oxygen and nitrogen at beta-cristobalite (100): a density functional theory study.

作者信息

Arasa C, Gamallo P, Sayós R

机构信息

Departament de Química Física i Centre de Recerca en Química Teorica, Universitat de Barcelona, C. Martí i Franquès 1, 08028 Barcelona, Spain.

出版信息

J Phys Chem B. 2005 Aug 11;109(31):14954-64. doi: 10.1021/jp044064y.

DOI:10.1021/jp044064y
PMID:16852894
Abstract

The adsorption of atomic oxygen and nitrogen on the beta-cristobalite (100) surface is investigated from first principles density functional calculations within the generalized gradient approximation. A periodic SiO2 slab model (6 layers relaxing 4 or 6) ended with a layer of Si or O atoms is employed throughout the study. Several adsorption minima and diffusion transition states have been characterized for the two lowest spin states of both systems. A strong chemisorption is found for either O or N in several sites with both slab endings (e.g., it is found an average adsorption energy of 5.89 eV for O (singlet state) and 4.12 eV for N (doublet state) over the Si face). The approach of O or N on top O gives place to the O2 and NO abstraction reactions without energy barriers. Atomic sticking coefficients and desorption rate constants have been estimated (300-1900 K) by using the standard transition state theory. The high adsorption energies found for O and N over silica point out that the atomic recombination processes (i.e., Eley-Rideal and Langmuir-Hinshelwood mechanisms) will play a more important role in the atomic detachment processes than the thermal desorption processes. Furthermore, the different behavior observed for the O and N thermal desorption processes suggests that the published kinetic models for atomic O and N recombination reactions on SiO2 surfaces, based on low adsorption energies (e.g., 3.5 eV for both O and N), should probably be revised.

摘要

采用广义梯度近似下的第一性原理密度泛函计算方法,研究了原子氧和氮在β-方石英(100)表面的吸附情况。在整个研究过程中,使用了一个周期性的SiO₂平板模型(6层,其中4层或6层弛豫),其末端为一层Si或O原子。对于这两种体系的两个最低自旋态,已经确定了几个吸附极小值和扩散过渡态。在两种平板末端的几个位点上,发现O或N都有很强的化学吸附作用(例如,在Si面上,O(单重态)的平均吸附能为5.89 eV,N(二重态)的平均吸附能为4.12 eV)。O或N靠近表面O原子会引发无能量势垒的O₂和NO提取反应。利用标准过渡态理论估算了原子吸附系数和解吸速率常数(300 - 1900 K)。在二氧化硅上发现的O和N的高吸附能表明,原子复合过程(即埃利-里德机理和朗缪尔-欣谢尔伍德机理)在原子脱附过程中比热脱附过程起着更重要的作用。此外,观察到的O和N热脱附过程的不同行为表明,基于低吸附能(例如,O和N均为3.5 eV)的已发表的SiO₂表面上原子O和N复合反应的动力学模型可能需要修正。

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