Yoshike K, Furuno A, Watanabe S, Uchida S, Matsubara K
Cold Spring Harb Symp Quant Biol. 1975;39 Pt 1:85-93. doi: 10.1101/sqb.1974.039.01.013.
We characterized defective DNA molecules of large-plaque and small-plaque SV40 produced and accumulated during serial undiluted passages. The electron microscope heteroduplex method revealed that defective SV40 DNA contains deletions, insertions and substitutions. The majority of the large-plaque defective molecules had a simple deletion. The deletions were heterogeneous in size, and the sites of deletion appeared to be mostly overlapping. The majority of the small-plaque defective molecules had a deletion, and more than half of the deletion molecules also had an insertion at a separate site. The small-plaque SV40 genome appeared to have more sites for deletion to occur than large-plaque SV40, and the deletions have occurred at more than two sites. The change of a local nucleo tide sequence resulting from mutation may be related to the difference between the two plaque types.
我们对在连续未稀释传代过程中产生并积累的大噬菌斑和小噬菌斑SV40的缺陷DNA分子进行了表征。电子显微镜异源双链法显示,缺陷型SV40 DNA包含缺失、插入和替换。大多数大噬菌斑缺陷分子有一个简单的缺失。这些缺失在大小上是异质的,并且缺失位点似乎大多重叠。大多数小噬菌斑缺陷分子有一个缺失,并且超过一半的缺失分子在另一个位点还有一个插入。小噬菌斑SV40基因组似乎比大噬菌斑SV40有更多发生缺失的位点,并且缺失发生在两个以上的位点。由突变导致的局部核苷酸序列的变化可能与两种噬菌斑类型之间的差异有关。