Yliniemi Sanna, Albert Jacques, Laronche Albane, Castro Jose M, Geraghty David, Honkanen Seppo
Optoelectronics Laboratory, Helsinki University of Technology, Espoo, Finland.
Appl Opt. 2006 Sep 1;45(25):6602-6. doi: 10.1364/ao.45.006602.
Polarization dependence of UV-written Bragg gratings in buried ion-exchanged glass waveguides is investigated. A polarization-dependent shift in Bragg wavelength of less than 0.02 nm is measured, both for the even and the odd modes of a laterally dual-mode waveguide. The measured wavelength shift corresponds to a waveguide birefringence of the order of 10(-5), which is negligible for most applications in optical communications. It is observed that the UV-induced birefringence is small, within the limits of the measurement accuracy. The thermal stability of the fabricated gratings is also very good. The results are of particular importance for devices considered here since they require a polarization-independent mode-converting waveguide Bragg grating. Polarization-independent performance of these gratings enables the fabrication of a new class of integrated optical devices for telecommunication applications.
研究了掩埋离子交换玻璃波导中紫外写入布拉格光栅的偏振依赖性。对于横向双模波导的偶数和奇数模式,均测量到布拉格波长小于0.02 nm的偏振相关位移。测得的波长位移对应于10^(-5)量级的波导双折射,这对于光通信中的大多数应用而言可忽略不计。观察到紫外诱导的双折射很小,处于测量精度范围内。所制备光栅的热稳定性也非常好。这些结果对于此处所考虑的器件尤为重要,因为它们需要偏振无关的模式转换波导布拉格光栅。这些光栅的偏振无关性能使得能够制造用于电信应用的新型集成光学器件。