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细胞迁移和上皮分层的二维阻抗成像。

Two-dimensional impedance imaging of cell migration and epithelial stratification.

作者信息

Linderholm Pontus, Braschler Thomas, Vannod Jeanne, Barrandon Yann, Brouard Michel, Renaud Philippe

机构信息

Laboratory of Microsystems, Swiss Federal Institute of Technology, 1015, Lausanne, Switzerland.

出版信息

Lab Chip. 2006 Sep;6(9):1155-62. doi: 10.1039/b603856e. Epub 2006 Aug 3.

Abstract

We present a miniaturized impedance imaging system, developed for 2D imaging of cell and tissue culture. The system is based on 16 microelectrodes (5 microm x 4 mm). An equivalent circuit for four-point (tetrapolar) impedance spectra was developed and validated. The system uses an Agilent 4294A impedance analyser combined with a front-end amplifier for the impedance measurements. Human epithelial stem cells (YF 29) were grown on the device surface. Cell migration speeds of 300 nm min(-1) following a "scratch" wound closure assay could be established. Using a commercial software developed for geophysical prospecting, we could generate impedance tomography images at 10 kHz revealing cell migration, increase of epithelial thickness and changes in tissue resistivity over a time course of several days.

摘要

我们展示了一种为细胞和组织培养的二维成像而开发的小型化阻抗成像系统。该系统基于16个微电极(5微米×4毫米)。开发并验证了用于四点(四极)阻抗谱的等效电路。该系统使用安捷伦4294A阻抗分析仪与前端放大器相结合进行阻抗测量。人类上皮干细胞(YF 29)在设备表面生长。通过“划痕”伤口闭合试验可以确定细胞迁移速度为300纳米/分钟(-1)。使用为地球物理勘探开发的商业软件,我们可以在10千赫时生成阻抗断层扫描图像,揭示细胞迁移、上皮厚度增加以及在几天的时间过程中组织电阻率的变化。

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