Indebetouw Guy
Department of Physics, Virginia Tech, Blacksburg, Virginia 24061-0435, USA.
J Opt Soc Am A Opt Image Sci Vis. 2006 Oct;23(10):2657-61. doi: 10.1364/josaa.23.002657.
A method to obtain the axial locations of objects reconstructed by scanning holographic microscopy with submicrometer accuracy is presented and demonstrated. The method combines the holographic advantage of capturing three-dimensional (3D) information in a single two-dimensional scan, with the possibility of optically sectioning the 3D holographic reconstruction a posteriori. The method is demonstrated experimentally for pointlike features (fluorescent beads), and the limitation of the method for features of arbitrary size and shape is discussed.
本文提出并演示了一种以亚微米精度获取通过扫描全息显微镜重建的物体轴向位置的方法。该方法将在单次二维扫描中捕获三维(3D)信息的全息优势,与对3D全息重建进行事后光学切片的可能性相结合。针对点状特征(荧光珠)对该方法进行了实验演示,并讨论了该方法对任意大小和形状特征的局限性。