Oshima Yusuke, Komachi Yuichi, Furihata Chie, Tashiro Hideo, Sato Hidetoshi
Tashiro Probing Technology Laboratory, Riken (The Institute of Physical and Chemical Research), Hirosawa, Wako-shi, Saitama 351-0198, Japan.
Appl Spectrosc. 2006 Sep;60(9):964-70. doi: 10.1366/000370206778397344.
A practical Raman analyzing technique with suppression of the strong fluorescent background in order to obtain quantitative information is proposed in the present study. The technique is based on the shifted excitation method and partial least squares regression (PLSR) analysis. The Raman system consists of a single Raman spectrometer, a background-free electrically tunable Ti:Sapphire laser (BF-ETL), and a micro-Raman probe (MRP). The system allows one to obtain reliable shifted excitation Raman spectra with a simple operation. The PLSR analysis successfully provides quantitative information from the obtained spectra with the suppression of random noise including photon shot noise. The present study demonstrates that the technique is effective for extracting quantitative information concealed behind a fluorescent background that is more than 200 times stronger than the Raman signal.
本研究提出了一种实用的拉曼分析技术,该技术可抑制强荧光背景以获取定量信息。该技术基于位移激发法和偏最小二乘回归(PLSR)分析。拉曼系统由一台拉曼光谱仪、一台无背景电可调谐钛宝石激光器(BF-ETL)和一个显微拉曼探头(MRP)组成。该系统通过简单的操作就能获得可靠的位移激发拉曼光谱。PLSR分析成功地从所获得的光谱中提供了定量信息,同时抑制了包括光子散粒噪声在内的随机噪声。本研究表明,该技术对于提取隐藏在比拉曼信号强200多倍的荧光背景后的定量信息是有效的。