Korendyke Clarence M, Brown Charles M, Thomas Roger J, Keyser Christian, Davila Joseph, Hagood Robert, Hara Hirohisa, Heidemann Klaus, James Adrian M, Lang James, Mariska John T, Moser John, Moye Robert, Myers Steven, Probyn Brian J, Seely John F, Shea John, Shepler Ed, Tandy Jason
Space Division, US Naval Research Laboratory, Washington DC 20375, USA.
Appl Opt. 2006 Dec 1;45(34):8674-88. doi: 10.1364/ao.45.008674.
The Extreme-Ultraviolet Imaging Spectrometer (EIS) is the first of a new generation of normal-incidence, two-optical-element spectroscopic instruments developed for space solar extreme-ultraviolet astronomy. The instrument is currently mounted on the Solar-B satellite for a planned launch in late 2006. The instrument observes in two spectral bands, 170-210 A and 250-290 A. The spectrograph geometry and grating prescription were optimized to obtain excellent imaging while still maintaining readily achievable physical and fabrication tolerances. A refined technique using low ruling density surrogate gratings and optical metrology was developed to align the instrument with visible light. Slit rasters of the solar surface are obtained by mechanically tilting the mirror. A slit exchange mechanism allows selection among four slits at the telescope focal plane. Each slit is precisely located at the focal plane. The spectrograph imaging performance was optically characterized in the laboratory. The resolution was measured using the Mg iii and Ne iii lines in the range of 171-200 A. The He ii line at 256 A and Ne iii lines were used in the range of 251-284 A. The measurements demonstrate an equivalent resolution of ~2 arc sec? on the solar surface, in good agreement with the predicted performance. We describe the EIS optics, mechanisms, and measured performance.
极紫外成像光谱仪(EIS)是为空间太阳极紫外天文学开发的新一代正入射、双光学元件光谱仪器中的首个仪器。该仪器目前安装在太阳-B卫星上,计划于2006年末发射。该仪器在170 - 210埃和250 - 290埃两个光谱波段进行观测。光谱仪的几何结构和光栅参数经过优化,以获得出色的成像效果,同时仍保持易于实现的物理和制造公差。开发了一种使用低刻线密度替代光栅和光学计量的精细技术,用于使仪器与可见光对准。通过机械倾斜镜子获得太阳表面的狭缝扫描图。狭缝交换机构允许在望远镜焦平面的四个狭缝之间进行选择。每个狭缝都精确位于焦平面上。光谱仪的成像性能在实验室中进行了光学表征。分辨率是使用171 - 200埃范围内的Mg iii和Ne iii谱线进行测量的。在251 - 284埃范围内使用了2氦ii谱线和Ne iii谱线。测量结果表明,在太阳表面的等效分辨率约为2角秒,与预测性能良好吻合。我们描述了EIS的光学系统、机构和测量性能。