Seijo Marianne, Ulrich Serge, Filella Montserrat, Buffle Jacques, Stoll Serge
CABE (Analytical and Biophysical Environmental Chemistry), Department of Inorganic, Analytical and Applied Chemistry, University of Geneva, Sciences II, 30 quai E. Ansermet, CH-1211, Geneva 4, Switzerland.
Phys Chem Chem Phys. 2006 Dec 28;8(48):5679-88. doi: 10.1039/b612118g. Epub 2006 Nov 14.
The surface site distribution and the dielectric discontinuity effects on the charging process of a spherical nanoparticle (NP) have been investigated. It is well known that electrostatic repulsion between charges on neighbouring sites tends to decrease the effective charge of a NP. The situation is more complicated close to a dielectric breakdown, since here a charged site is not only interacting with its neighbours but also with its own image charge and the image charges of all its neighbours. Coexistence of opposite charges, titration sites positions, and pH dependence are systematically studied using a grand canonical Monte Carlo method. A Tanford and Kirkwood approach has been applied to describe the interaction potentials between explicit discrete ampholytic charging sites. Homogeneous, heterogeneous and patch site distributions were considered to reproduce the titration site distribution at the solid/solution interface of natural NPs. Results show that the charging process is controlled by the balance between Coulomb interactions and the reaction field through the solid-liquid interface. They also show that the site distribution plays a crucial role in the charging process. In patch distributions, charges accumulate at the perimeter of each patch due to finite size effects. When homogeneous and heterogeneous distributions are compared, three different charging regimes are obtained. In homogeneous and heterogeneous (with quite low polydispersity indexes) distributions, the effects of the NP dielectric constant on Coulomb interactions are counterbalanced by the reaction field and in this case, the dielectric breakdown has no significant effect on the charging process. This is not the case in patch distributions, where the dielectric breakdown plays a crucial role in the charging process.
研究了表面位点分布和介电不连续性对球形纳米颗粒(NP)充电过程的影响。众所周知,相邻位点上电荷之间的静电排斥倾向于降低NP的有效电荷。在接近介电击穿时情况更为复杂,因为此时一个带电位点不仅与其相邻位点相互作用,还与其自身的镜像电荷以及所有相邻位点的镜像电荷相互作用。使用巨正则蒙特卡罗方法系统地研究了相反电荷的共存、滴定位点位置和pH依赖性。已应用坦福德和柯克伍德方法来描述明确离散两性离子充电位点之间的相互作用势。考虑了均匀、非均匀和斑块位点分布,以再现天然NP固/液界面处的滴定位点分布。结果表明,充电过程由库仑相互作用和通过固液界面的反应场之间的平衡控制。结果还表明,位点分布在充电过程中起着关键作用。在斑块分布中,由于有限尺寸效应,电荷在每个斑块的周边积累。当比较均匀分布和非均匀分布(具有相当低的多分散指数)时,得到了三种不同的充电模式。在均匀分布和非均匀分布(多分散指数相当低)中,NP介电常数对库仑相互作用的影响被反应场抵消,在这种情况下,介电击穿对充电过程没有显著影响。在斑块分布中情况并非如此,其中介电击穿在充电过程中起着关键作用。