Qin Lu-Chang
W.M. Keck Laboratory for Atomic Imaging and Manipulation, Department of Physics and Astronomy, and Curriculum in Applied and Materials Sciences, University of North Carolina, Chapel Hill, NC 27599-3255, USA.
Phys Chem Chem Phys. 2007 Jan 7;9(1):31-48. doi: 10.1039/b614121h. Epub 2006 Nov 22.
The atomic structure of a carbon nanotube can be defined by the chiral indices, (n,m), that specify its perimeter vector (chiral vector), with which the diameter and helicity are also determined. The fine electron beam available in a modern Transmission Electron Microscope (TEM) offers a unique and powerful probe to reveal the atomic structure of individual nanotubes. This article covers two aspects related to the use of the electron probe in the TEM for the study of carbon nanotubes: (i) to express the electron diffraction intensity distribution in the electron diffraction patterns of carbon nanotubes and (ii) to obtain the chiral indices (n,m) of carbon nanotubes from their electron diffraction patterns. For a nanotube of given chiral indices (n,m), the electron scattering amplitude from the carbon nanotube can be expressed analytically in closed form using the helical diffraction theory, from which its electron diffraction pattern can be calculated and understood. The reverse problem, i.e., assignment of the chiral indices (n,m) of a carbon nanotube from its electron diffraction pattern, is approached from the relationship between the electron diffraction intensity distribution and the chiral indices (n,m). The first method is to obtain indiscriminately the chiral indices (n,m) by reading directly the intensity distribution on the three principal layer lines, l(1), l(2), and l(3), which have intensities proportional to the square of the Bessel functions of orders m, n, and n + m: I(l1) proportional, variant |J(m) (pidR)|(2), I(l2) proportional, variant |J(n) (pidR)|(2), and I(l3) proportional, variant |J(n+m) (pidR)|(2). The second method is to obtain and use the ratio of the indices n/m = (2D(1)-D(2))/(2D(2)-D(1)) in which D(1) and D(2) are the spacings of principal layer lines l(1) and l(2), respectively. Examples of using these methods are also illustrated in the determination of chiral indices of isolated individual single-walled carbon nanotubes, a bundle of single-walled carbon nanotubes, and multi-walled carbon nanotubes.
碳纳米管的原子结构可由手性指数(n,m)定义,该指数指定其周长矢量(手性矢量),据此还可确定其直径和螺旋度。现代透射电子显微镜(TEM)中可用的精细电子束提供了一种独特且强大的探针,用于揭示单个纳米管的原子结构。本文涵盖了与在TEM中使用电子探针研究碳纳米管相关的两个方面:(i)表示碳纳米管电子衍射图案中的电子衍射强度分布,以及(ii)从其电子衍射图案中获取碳纳米管的手性指数(n,m)。对于给定手性指数(n,m)的纳米管,利用螺旋衍射理论可以解析地以封闭形式表示来自碳纳米管的电子散射振幅,据此可以计算并理解其电子衍射图案。相反的问题,即从其电子衍射图案确定碳纳米管的手性指数(n,m),则从电子衍射强度分布与手性指数(n,m)之间的关系入手。第一种方法是通过直接读取三条主层线l(1)、l(2)和l(3)上的强度分布来不加区分地获取手性指数(n,m),这三条主层线的强度与阶数为m、n和n + m的贝塞尔函数的平方成正比:I(l1) ∝ |J(m)(πdR)|²,I(l2) ∝ |J(n)(πdR)|²,I(l3) ∝ |J(n+m)(πdR)|²。第二种方法是获取并使用指数比n/m = (2D(1) - D(2))/(2D(2) - D(1)),其中D(1)和D(2)分别是主层线l(1)和l(2)的间距。在确定孤立的单个单壁碳纳米管、一束单壁碳纳米管和多壁碳纳米管的手性指数时,还举例说明了这些方法的使用情况。