飞行时间二次离子质谱法用于固态药物的表面表征

Time-of-flight secondary-ion mass spectrometry for the surface characterization of solid-state pharmaceuticals.

作者信息

Prestidge Clive A, Barnes Timothy J, Skinner William

机构信息

Ian Wark Research Institute, The Australian Research Council Special Research Centre for Particle and Material Interfaces, University of South Australia, Mawson Lakes, SA 5095, Australia.

出版信息

J Pharm Pharmacol. 2007 Feb;59(2):251-9. doi: 10.1211/jpp.59.2.0011.

DOI:10.1211/jpp.59.2.0011

PMID:17270078

Abstract

Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is a highly surface sensitive analytical method for surface chemical identification and surface chemical distribution analysis (mapping). Here we have explored the application of ToF-SIMS for the characterization of solid-state pharmaceuticals and highlight specific case studies concerning the distribution and stability of pharmaceutical actives within solid matrices (pellets and polymeric carriers) and the face-specific properties of pharmaceutical crystals.

摘要

飞行时间二次离子质谱（ToF-SIMS）是一种对表面高度敏感的分析方法，用于表面化学鉴定和表面化学分布分析（测绘）。在此，我们探索了ToF-SIMS在固态药物表征方面的应用，并重点介绍了一些具体案例研究，这些研究涉及药物活性成分在固体基质（药丸和聚合物载体）中的分布和稳定性以及药物晶体的晶面特异性性质。