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Structure of liquid SiO2: a measurement by high-energy x-ray diffraction.

作者信息

Mei Q, Benmore C J, Weber J K R

机构信息

Intense Pulsed Neutron Source Division, Argonne National Laboratory, Argonne, Illinois 60439, USA.

出版信息

Phys Rev Lett. 2007 Feb 2;98(5):057802. doi: 10.1103/PhysRevLett.98.057802.

DOI:10.1103/PhysRevLett.98.057802
PMID:17358901
Abstract

The x-ray structure factor for liquid SiO2 has been measured by laser heating of an aerodynamically levitated droplet. The main structural changes of the melt compared to the room temperature glass are associated with an increase in the size of the SiO4 tetrahedra, indicating a small reduction in the average Si-O-Si bond torsion angle and an expansion of the network between 5 and 9 A. Strong directional bonds with little high temperature broadening and a high degree of intermediate range order are found to persist in the liquid state.

摘要

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