Wagenaars E, Bowden M D, Kroesen G M W
Department of Applied Physics, Eindhoven University of Technology, P.O. Box 513, 5600 MB Eindhoven, The Netherlands.
Phys Rev Lett. 2007 Feb 16;98(7):075002. doi: 10.1103/PhysRevLett.98.075002. Epub 2007 Feb 14.
Using laser-induced fluorescence-dip Stark spectroscopy, we performed time-resolved, direct measurements of electric-field strengths during the breakdown phase of a low-pressure, pulsed discharge in xenon. With this experimental technique we could for the first time quantitatively measure the time evolution of the driving force of the plasma breakdown process: the electric field. Moving ionization fronts were measured with submicrosecond resolution. These ionization fronts were sustained by a spatially narrow, rapidly moving region of strong electric field.
利用激光诱导荧光-双斯塔克光谱技术,我们对氙气中低压脉冲放电击穿阶段的电场强度进行了时间分辨的直接测量。通过这种实验技术,我们首次能够定量测量等离子体击穿过程驱动力(即电场)的时间演化。以亚微秒分辨率测量了移动的电离前沿。这些电离前沿由一个空间狭窄、快速移动的强电场区域维持。