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头影测量中垂直参数的评估。

Evaluation of vertical parameters in cephalometry.

作者信息

Bock Jens Johannes, Fuhrmann Robert A W

机构信息

Department of Orthodontics, Martin Luther University Halle-Wittenberg, Halle/Saale, Germany.

出版信息

J Orofac Orthop. 2007 May;68(3):210-22. doi: 10.1007/s00056-007-0646-9.

Abstract

AIM

The aim of this study was to determine the validity of different vertical parameters in cephalometry.

MATERIALS AND METHODS

The cephalograms of 94 patients were used in this study. The inclusion criteria were as follows: skeletal Class I, completion of maximum skeletal growth, and no history of orthodontic therapy. The control group consisted of 34 subjects with very good occlusion (overbite 2-4 mm). The patients were classified with the help of dental casts: Group 1 (n = 31) patients with cover-bite (overbite > 5.5 mm) and Group 2 (n = 29) patients with anterior open bite (overbite < -0.5 mm). In addition to the 24 standard cephalometric measurements (Bergen-Analysis), we included individualized norm values (Segner & Hasund), the Overbite Depth Indicator (ODI) described by Kim, the Denture Frame Analysis (DFA) described by Sato, and facial-type evaluations according to Schopf.

RESULTS

We observed significant differences among the three study groups in all the vertical parameters tested. We demonstrated statistically-significant classification results for the Segner & Hasund harmony box's individualized norm values (83.8%), and those of the ODI (77.7%) and ML-AB angle (76.6%).

CONCLUSIONS

Based on the vertical cephalometric parameters, we succeeded in statistically differentiating among the groups with open bite, cover-bite and the control group. Various measurements must be taken to ensure that the cephalometric vertical relationships are reliably evaluated.

摘要

目的

本研究旨在确定头影测量中不同垂直参数的有效性。

材料与方法

本研究使用了94例患者的头影测量片。纳入标准如下:骨骼I类,骨骼生长已完成,且无正畸治疗史。对照组由34名咬合非常好(覆合2 - 4毫米)的受试者组成。患者通过石膏模型进行分类:第1组(n = 31)为覆合超深(覆合> 5.5毫米)患者,第2组(n = 29)为前牙开颌(覆合< -0.5毫米)患者。除了24项标准头影测量(卑尔根分析法)外,我们还纳入了个性化标准值(西格纳尔和哈松德法)、金描述的覆合深度指标(ODI)、佐藤描述的义齿框架分析(DFA)以及根据朔普夫法进行的面部类型评估。

结果

我们观察到在所有测试的垂直参数方面,三个研究组之间存在显著差异。我们证明了西格纳尔和哈松德和谐框的个性化标准值(83.8%)、ODI(77.7%)以及ML - AB角(76.6%)的分类结果具有统计学意义。

结论

基于垂直头影测量参数,我们成功地在统计学上区分了开颌组、覆合超深组和对照组。必须采用各种测量方法以确保对头影测量的垂直关系进行可靠评估。

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