弯曲晶体X射线发射光谱仪的设计与性能

Design and performance of a curved-crystal x-ray emission spectrometer.

作者信息

Hudson A C, Stolte W C, Lindle D W, Guillemin R

机构信息

University of Nevada, Las Vegas, NV 89154, USA.

出版信息

Rev Sci Instrum. 2007 May;78(5):053101. doi: 10.1063/1.2735933.

DOI:10.1063/1.2735933

PMID:17552806

Abstract

A curved-crystal x-ray emission spectrometer has been designed and built to measure 2-5 keV x-ray fluorescence resulting from a core-level excitation of gas phase species. The spectrometer can rotate 180 degrees, allowing detection of emitted x rays with variable polarization angles, and is capable of collecting spectra over a wide energy range (20 eV wide with 0.5 eV resolution at the Cl K edge) simultaneously. In addition, the entire experimental chamber can be rotated about the incident-radiation axis by nearly 360 degrees while maintaining vacuum, permitting measurements of angular distributions of emitted x rays.

摘要

已设计并制造了一种弯曲晶体X射线发射光谱仪，用于测量气相物种的芯能级激发所产生的2 - 5 keV X射线荧光。该光谱仪可旋转180度，能够检测具有可变偏振角的发射X射线，并且能够同时在宽能量范围内（在Cl K边处为20 eV宽，分辨率为0.5 eV）收集光谱。此外，整个实验腔室可在保持真空的情况下绕入射辐射轴旋转近360度，从而允许测量发射X射线的角分布。