Sakurai Kenji, Mizusawa Mari, Terada Yasuko
National Institute for Materials Science, Sengen, Tsukuba, Ibaraki 305-0047, Japan.
Rev Sci Instrum. 2007 Jun;78(6):066108. doi: 10.1063/1.2747155.
X-ray fluorescence analysis is a highly useful technique for determining the chemical composition of matter. The present article describes the successful development of a wavelength-dispersive x-ray fluorescence spectrometer for a fairly high-energy range, 30-60 keV, that can contribute to studying lanthanides' Kbeta spectra with high-energy resolution. By combining a new high-energy synchrotron light source and the present spectrometer, it has been demonstrated that the full width at half maximum for lanthanum's Kbeta(1) is 32 eV and that all the peaks in the spectra are fully resolved. This corresponds to an energy resolution EDeltaE of 1180, which is ten times better than a conventional system based on a Ge detector, which can detect only two peaks, Kbeta(1) and Kbeta(2), in seven peaks. The present spectrometer can open up a new field in x-ray spectrometry.
X射线荧光分析是一种用于确定物质化学成分的非常有用的技术。本文描述了一种适用于30 - 60 keV相当高能量范围的波长色散X射线荧光光谱仪的成功研制，该光谱仪有助于以高能量分辨率研究镧系元素的Kβ光谱。通过将新型高能量同步辐射光源与该光谱仪相结合，已证明镧的Kβ(1)的半高宽为32 eV，并且光谱中的所有峰都能完全分辨。这对应于1180的能量分辨率E/ΔE，比基于锗探测器的传统系统好十倍，传统系统在七个峰中只能检测到两个峰，即Kβ(1)和Kβ(2)。该光谱仪可为X射线光谱学开辟一个新领域。
