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通过摩擦力显微镜对单个微球之间的摩擦力进行定量测量。

Quantitative measurement of friction between single microspheres by friction force microscopy.

作者信息

Ling Xing, Butt Hans-Jürgen, Kappl Michael

机构信息

Max Planck Institute for Polymer Research, Ackermannweg 10, 55128 Mainz, Germany.

出版信息

Langmuir. 2007 Jul 31;23(16):8392-9. doi: 10.1021/la700408v. Epub 2007 Jul 10.

DOI:10.1021/la700408v
PMID:17622158
Abstract

The sliding friction between single silica microspheres was examined by applying friction force microscopy to probe the interaction between spherical silica particles glued to a tipless atomic force microscopy (AFM) cantilever and another particle glued to a glass slide. A three-dimensional model handling the complex contact geometry between spherical particles was established to compute friction and normal forces at the sliding interface from measured deflections of the AFM cantilever. Results obtained at different loads show a linear relationship between friction and normal force, with a friction coefficient of 0.4 between silica spheres. Friction in this system occurs at multi-asperity contacts. The results show that the macroscopic friction law of Amontons can be used to model the friction behavior of micrometer-sized granular matter. For plasma-treated silica particles, increased friction as well as wear could be observed during sliding.

摘要

通过应用摩擦力显微镜来检测单个二氧化硅微球之间的滑动摩擦,以探测粘贴在无尖原子力显微镜(AFM)悬臂上的球形二氧化硅颗粒与粘贴在载玻片上的另一个颗粒之间的相互作用。建立了一个处理球形颗粒之间复杂接触几何形状的三维模型,以便根据AFM悬臂的测量挠度计算滑动界面处的摩擦力和法向力。在不同载荷下获得的结果表明,摩擦力与法向力之间存在线性关系,二氧化硅球之间的摩擦系数为0.4。该系统中的摩擦发生在多粗糙接触处。结果表明,阿蒙顿宏观摩擦定律可用于模拟微米级颗粒物质的摩擦行为。对于经过等离子体处理的二氧化硅颗粒,在滑动过程中可以观察到摩擦力和磨损的增加。

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