压电力显微镜背景对铁电畴结构成像的影响。

Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures.

作者信息

Jungk T, Hoffmann A, Soergel E

机构信息

Institute of Physics, University of Bonn, Wegelerstrasse 8, 53115 Bonn, Germany.

出版信息

J Microsc. 2007 Jul;227(Pt 1):72-8. doi: 10.1111/j.1365-2818.2007.01783.x.

DOI:10.1111/j.1365-2818.2007.01783.x

PMID:17635660

Abstract

The interpretation of ferroelectric domain images obtained with a piezoresponse force microscope (PFM) is discussed. The influence of an inherent experimental background on the domain contrast in PFM images (enhancement, nulling, inversion) as well as on the shape and the location of the domain boundaries are described. We present experimental results to evidence our analysis of the influence of the background on the domain contrast in PFM images.

摘要

本文讨论了利用压电力显微镜（PFM）获得的铁电畴图像的解释。描述了固有实验背景对PFM图像中畴对比度（增强、归零、反转）以及畴界形状和位置的影响。我们给出了实验结果，以证明我们对背景对PFM图像中畴对比度影响的分析。