特邀综述文章：用于将微米和纳米颗粒附着到探针尖端以进行表面力和近场光学测量的技术综述。

Invited review article: a review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements.

作者信息

Gan Yang

机构信息

Chemical Engineering, School of Engineering, University of Newcastle, Callaghan, NSW, Australia.

出版信息

Rev Sci Instrum. 2007 Aug;78(8):081101. doi: 10.1063/1.2754076.

DOI:10.1063/1.2754076

PMID:17764306

Abstract

Cantilevers with single micro- or nanoparticle probes have been widely used for atomic force microscopy surface force measurements and apertureless scanning near-field optical microscopy applications. In this article, I critically review the particle attachment and modification techniques currently available, to help researchers choose the appropriate techniques for specific applications.

摘要

带有单个微粒子或纳米粒子探针的悬臂已广泛用于原子力显微镜表面力测量和无孔扫描近场光学显微镜应用。在本文中，我将批判性地回顾当前可用的粒子附着和修饰技术，以帮助研究人员为特定应用选择合适的技术。