Science. 1991 Mar 15;251(4999):1343-6. doi: 10.1126/science.251.4999.1343.
The processes involved in the dissolution and growth of crystals are closely related. Atomic force microscopy (AFM) of faceted pits (called negative crystals) formed during quartz dissolution reveals subtle details of these underlying physical mechanisms for silicates. In imaging these surfaces, the AFM detected ledges <1 nanometer (nm) high that were spaced 10 to 90 nm apart. A dislocation pit, invisible to optical and scanning electron microscopy measurements and serving as a ledge source, was also imaged. These observations confirm the applicability of ledge-motion models to dissolution and growth of silicates; coupled with measurements of dissolution rate on facets, these methods provide a powerful tool for probing mineral surface kinetics.
晶体溶解和生长过程密切相关。原子力显微镜（AFM）对石英溶解过程中形成的晶面蚀坑（称为负晶体）的研究揭示了硅酸盐潜在物理机制的细微特征。在对这些表面进行成像时，AFM 检测到高度小于 1 纳米（nm）、间距为 10 至 90nm 的阶跃。位错蚀坑（在光学和扫描电子显微镜测量中不可见，是阶跃源）也被成像。这些观察结果证实了阶跃运动模型在硅酸盐溶解和生长中的适用性；结合晶面溶解速率的测量，这些方法为探测矿物表面动力学提供了有力的工具。
