Science. 1966 Jul 8;153(3732):168-70. doi: 10.1126/science.153.3732.168.
Fourier analysis of electron micrographs has been accomplished underptimum conditions with a gas laser as the light source for an optical diffractometer.
已经在最佳条件下,用气体激光器作为光学绕射计的光源,对电子显微镜的照片进行了傅里叶分析。