Science. 1993 Apr 16;260(5106):332-5. doi: 10.1126/science.260.5106.332.
The liquid-vapor interface of a bismuth-gallium mixture (0.2 percent bismuth and 99.8 percent gallium) at 36 degrees C has been studied by grazing incidence x-ray diffraction. The data show, in agreement with thermodynamic arguments, that bismuth is heavily concentrated in the liquid-vapor interface. The x-ray diffraction data are interpreted with the assistance of a simple model that represents the interface as a partial monolayer of bismuth. This analysis leads to the conclusion that the bismuth concentration in the interface is about 80 percent, that there is no significant mixing of gallium and bismuth in the interface, and that the structure function of the interfacial bismuth is like that of supercooled bulk liquid bismuth.
在 36 摄氏度下，通过掠入射 X 射线衍射研究了铋-镓混合物（0.2%铋和 99.8%镓）的液-气相界面。数据表明，与热力学论据一致，铋在液-气相界面中高度富集。借助于代表界面为铋部分单层的简单模型来解释 X 射线衍射数据。该分析得出的结论是，界面处的铋浓度约为 80%，界面处没有镓和铋的明显混合，界面处铋的结构函数与过冷块状液态铋的结构函数相似。
