Elkaseh A A O, Büttner U, Meincken M, Hardie G L, Srinivasu V V, Perold W J
Department of Electrical and Electronic Engineering, Stellenbosch University, Stellenbosch 7600, South Africa.
J Nanosci Nanotechnol. 2007 Sep;7(9):3348-9. doi: 10.1166/jnn.2007.892.
Utilizing atomic force microscope (AFM) with a diamond tip, we were able to successfully plough nano-constrictions on epitaxially grown YBa2Cu3O(7-x) thin films deposited on MgO substrates. The thickness, width, and length of the obtained constrictions were in the range of a few 100 nm. Furthermore, we managed to produce a new S-type constriction, of which the dimensions are easier to control than for conventional constrictions.
利用配备金刚石尖端的原子力显微镜（AFM），我们成功地在沉积在氧化镁衬底上的外延生长的YBa2Cu3O(7-x)薄膜上刻划出纳米缩颈。所获得缩颈的厚度、宽度和长度在几百纳米范围内。此外，我们成功制造出一种新型S型缩颈，其尺寸比传统缩颈更容易控制。
