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用于断层放射治疗质量保证的金属氧化物半导体场效应晶体管探测器

MOSFET detectors in quality assurance of tomotherapy treatments.

作者信息

Cherpak Amanda, Studinski Ryan C N, Cygler Joanna E

机构信息

Department of Medical Physics, The Ottawa Hospital Regional Cancer Centre, Ottawa, Canada.

出版信息

Radiother Oncol. 2008 Feb;86(2):242-50. doi: 10.1016/j.radonc.2007.10.025. Epub 2007 Nov 26.

Abstract

BACKGROUND AND PURPOSE

The purpose of this work was to characterize metal oxide semiconductor field-effect transistors (MOSFETs) in a 6 MV conventional linac and investigate their use for quality assurance of radiotherapy treatments with a tomotherapy Hi-Art unit.

MATERIALS AND METHODS

High sensitivity and standard sensitivity MOSFETs were first calibrated and then tested for reproducibility, field size dependence, and accuracy of measuring surface dose in a 6 MV beam as well as in a tomotherapy Hi-Art unit. In vivo measurements were performed on both a RANDO phantom and several head and neck cancer patients treated with tomotherapy and compared to TLD measurements and treatment plan doses to evaluate the performance of MOSFETs in a high gradient radiation field.

RESULTS

The average calibration factor found was 0.345+/-2.5%cGy/mV for the high sensitivity MOSFETs tested and 0.901+/-2.4%cGy/mV for the standard sensitivity MOSFETs. MOSFET measured surface doses had an average agreement with ion chamber measurements of 1.55% for the high sensitivity MOSFET and 5.23% for the standard sensitivity MOSFET when averaged over all trials and field sizes tested. No significant dependence on field size was found for the standard sensitivity MOSFETs, however a maximum difference of 5.34% was found for the high sensitivity MOSFET calibration factors in the field sizes tested. Measurements made with MOSFETS on head and neck patients treated on a tomotherapy Hi-Art unit had an average agreement of (3.26+/-0.03)% with TLD measurements, however the average of the absolute difference between the MOSFET measurements and the treatment plan skin doses was (12.2+/-7.5)%. The MOSFET measured patient skin doses also had good reproducibility, with inter-fraction deviations ranging from 1.4% to 6.6%. Similar results were found from trials using a RANDO phantom.

CONCLUSIONS

The MOSFETs performed well when used in the tomotherapy Hi-Art unit and did not increase the overall treatment set-up time when used for patient measurements. It was found that MOSFETs are suitable detectors for surface dose measurements in both conventional beam and tomotherapy treatments and they can provide valuable skin dose information in areas where the treatment planning system may not be accurate.

摘要

背景与目的

本研究旨在对6兆伏常规直线加速器中的金属氧化物半导体场效应晶体管(MOSFET)进行特性描述,并研究其在螺旋断层放射治疗系统(Hi-Art)放射治疗质量保证中的应用。

材料与方法

首先对高灵敏度和标准灵敏度的MOSFET进行校准,然后测试其在6兆伏射束以及螺旋断层放射治疗系统中的可重复性、射野大小依赖性和表面剂量测量的准确性。在RANDO体模以及数名头颈部癌螺旋断层放射治疗患者身上进行体内测量,并与热释光剂量计(TLD)测量结果和治疗计划剂量进行比较,以评估MOSFET在高梯度辐射场中的性能。

结果

所测试的高灵敏度MOSFET的平均校准因子为0.345±2.5%cGy/mV,标准灵敏度MOSFET的平均校准因子为0.901±2.4%cGy/mV。在所有测试的试验和射野大小上进行平均后,高灵敏度MOSFET测量的表面剂量与电离室测量结果的平均一致性为1.55%,标准灵敏度MOSFET为5.23%。对于标准灵敏度MOSFET,未发现对射野大小有显著依赖性,然而在所测试的射野大小中,高灵敏度MOSFET校准因子的最大差异为5.34%。在螺旋断层放射治疗系统Hi-Art上接受治疗的头颈部患者中,MOSFET测量结果与TLD测量结果的平均一致性为(3.26±0.03)%,然而MOSFET测量结果与治疗计划皮肤剂量之间的绝对差异平均值为(12.2±7.5)%。MOSFET测量的患者皮肤剂量也具有良好的可重复性,分次间偏差范围为1.4%至6.6%。使用RANDO体模进行的试验也得到了类似结果。

结论

MOSFET在螺旋断层放射治疗系统Hi-Art中使用时性能良好,用于患者测量时不会增加总体治疗准备时间。研究发现,MOSFET是常规射束和螺旋断层放射治疗中表面剂量测量的合适探测器,并且在治疗计划系统可能不准确的区域,它们可以提供有价值的皮肤剂量信息。

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