Taylor K A, Crowther R A
Cell Biology Department, Duke University Medical Center, Durham, NC 27710.
Ultramicroscopy. 1991 Oct;38(1):85-103. doi: 10.1016/0304-3991(91)90110-r.
Oblique section 3D reconstruction can produce a 3D image of a sectioned crystal from a single electron micrograph. We describe here in detail a reconstruction protocol applicable to an electron micrograph of an oblique section through a 3D crystal. The protocol is described in six steps: (1) selection criteria for images, (2) preprocessing steps to correct for image defects, (3) determination of unit cell coordinates, (4) interpolation of strip images with correction for image distortions and crystal disorder, (5) production of a crystallographic serial section reconstruction, (6) correction for skewed sampling to produce an oblique section reconstruction. In addition, we explore Wiener filter deconvolution of the section thickness. We describe a method for determining the section thickness by comparing data from projections of the oblique section reconstruction with corresponding data from a thick longitudinal section. Several schemes for Wiener filter deconvolution are described that differ in the way information on the signal-to-noise ratio is used in the filter.
倾斜截面三维重建可以从单张电子显微照片生成切片晶体的三维图像。我们在此详细描述一种适用于通过三维晶体的倾斜截面电子显微照片的重建方案。该方案分六个步骤描述：（1）图像选择标准，（2）校正图像缺陷的预处理步骤，（3）晶胞坐标的确定，（4）对条带图像进行插值并校正图像畸变和晶体无序，（5）生成晶体学连续截面重建，（6）校正倾斜采样以生成倾斜截面重建。此外，我们探讨了截面厚度的维纳滤波去卷积。我们描述了一种通过比较倾斜截面重建投影数据与厚纵向截面相应数据来确定截面厚度的方法。还描述了几种维纳滤波去卷积方案，它们在滤波器中使用信噪比信息的方式上有所不同。
