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一种用于事件相关脑磁图测量中眨眼伪迹的自动识别与去除方法。

An automatic identification and removal method for eye-blink artifacts in event-related magnetoencephalographic measurements.

作者信息

Okada Y, Jung J, Kobayashi T

机构信息

Department of Electrical Engineering, Graduate School of Engineering, Kyoto University, Kyotodaigaku-katsura, Nishikyo-ku, Kyoto 615-8510, Japan.

出版信息

Physiol Meas. 2007 Dec;28(12):1523-32. doi: 10.1088/0967-3334/28/12/006. Epub 2007 Oct 31.

Abstract

While measuring event-related magnetoencephalographic (MEG) signals using visual stimuli, eye blinks were inevitable and generated large magnetic artifacts. Since trials containing eye blinks were excluded from the analyses, the signal-to-noise ratio of the event-related signals was decreased. In this study, we propose a method to identify the eye blink magnetic artifacts and remove them automatically using independent component analysis preprocessed by principal component analysis. The method evaluates the spatiotemporal similarity between independent components and both MEG and electro-oculogram data based on a newly devised cost function. Testing of the method on event-related MEG signals measured by a 306-channel whole-head system in a visual perception task led to the successful identification and removal of eye-blink artifacts in all trials containing eye blinks from all the seven subjects.

摘要

在使用视觉刺激测量事件相关脑磁图(MEG)信号时,眨眼是不可避免的,并会产生大的磁伪迹。由于包含眨眼的试验被排除在分析之外,事件相关信号的信噪比降低。在本研究中,我们提出了一种方法,通过主成分分析预处理的独立成分分析来识别眨眼磁伪迹并自动去除它们。该方法基于新设计的代价函数评估独立成分与MEG和眼电图数据之间的时空相似性。在视觉感知任务中,使用306通道全头系统测量的事件相关MEG信号对该方法进行测试,成功识别并去除了所有七名受试者所有包含眨眼的试验中的眨眼伪迹。

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