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成像干涉光刻:逼近光学分辨率极限

Imaging interferometric lithography: approaching the resolution limits of optics.

作者信息

Chen X, Brueck S R

出版信息

Opt Lett. 1999 Feb 1;24(3):124-6. doi: 10.1364/ol.24.000124.

Abstract

The resolution limits of conventional optical lithography reflect the low-pass spatial-frequency [numerical aperture (NA) /lambda] filter characteristics of the imaging system. Imaging interferometric lithography extends the resolution of optical lithography to the spatial-frequency limits of optics (2/lambda) . Off-axis illumination downshifts the high-frequency components of the mask pattern. An interferometric beam at the wafer upshifts these frequency components back to their original spatial frequencies following the lens. 2x reduction imaging interferometric lithography experiments demonstrate a continuous frequency coverage up to ~3N.A./lambda with a consequent threefold resolution enhancement.

摘要

传统光学光刻的分辨率极限反映了成像系统的低通空间频率[数值孔径(NA)/波长]滤波器特性。成像干涉光刻将光学光刻的分辨率扩展到光学的空间频率极限(2/波长)。离轴照明使掩模图案的高频成分下移。晶圆上的干涉光束将这些频率成分沿透镜上移回其原始空间频率。2倍缩小成像干涉光刻实验表明,频率连续覆盖高达~3NA/波长,分辨率相应提高了三倍。

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