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Beam-quality measurement of a focused high-order harmonic beam.

作者信息

Le Déroff L, Salières P, Carré B

机构信息

Commissariat à l'Energie Atomique, Direction des Sciences de Matière/Département de Recherche sur l'Etat Condensé, Atomes et Molécules/Service des Photons, Atomes et Molécules, Centre d'Etudes de Saclay, 91191 Gif-sur-Yvette, France.

出版信息

Opt Lett. 1998 Oct 1;23(19):1544-6. doi: 10.1364/ol.23.001544.

Abstract

Using a multilayer spherical mirror, we focus the high-order harmonic radiation produced near 55 nm by the nonlinear interaction of an intense femtosecond laser pulse and a xenon gas jet. The focused XUV beam is characterized by a knife-edge technique in the focal region and by far-field imaging. We show that good-quality beams, nearly two times diffraction limited, can be generated, a conclusion that is at variance with recent predictions of harmonic phase-front distortion. Spot sizes close to 10 microm are obtained, resulting in a high XUV intensity. Increasing the gas density and the length of the generating medium results in a large increase in the divergence in and degradation of the beam quality.

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