超高强度下的光电效应。
Photoelectric effect at ultrahigh intensities.
作者信息
Sorokin A A, Bobashev S V, Feigl T, Tiedtke K, Wabnitz H, Richter M
机构信息
Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, D-10587 Berlin, Germany.
出版信息
Phys Rev Lett. 2007 Nov 23;99(21):213002. doi: 10.1103/PhysRevLett.99.213002. Epub 2007 Nov 20.
In the spectral range of the extreme ultraviolet at a wavelength of 13.3 nm, we have studied the photoionization of xenon at ultrahigh intensities. For our ion mass-to-charge spectroscopy experiments, irradiance levels from 10(12) to 10(16) W cm(-2) were achieved at the new free-electron laser in Hamburg FLASH by strong beam focusing with the aid of a spherical multilayer mirror. Ion charges up to Xe21+ were observed and investigated as a function of irradiance. Our surprising results are discussed in terms of a perturbative and nonperturbative description.
在波长为13.3纳米的极紫外光谱范围内，我们研究了超高强度下氙的光电离。对于我们的离子质荷比光谱实验，借助球面多层镜进行强光束聚焦，在汉堡FLASH的新型自由电子激光器上实现了10¹²至10¹⁶瓦/平方厘米的辐照度水平。观察到了高达Xe²¹⁺的离子电荷，并研究了其作为辐照度的函数关系。我们令人惊讶的结果将根据微扰和非微扰描述进行讨论。
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