Sthal F, Mourey M, Marionnet F, Walls W F
Ecole Nat. Superieure de Mecanique et des Microtechnique, Besancon.
IEEE Trans Ultrason Ferroelectr Freq Control. 2000;47(2):369-73. doi: 10.1109/58.827422.
In this paper, we review a new piece of equipment that allows one to characterize the phase noise of crystal resonators using a phase bridge system with carrier suppression. This equipment allows one to measure the inherent phase stability of quartz crystal resonators in a passive circuit without the noise usually associated with an active oscillator. We achieved a system noise floor of approximately -150 dBc/Hz at 1 Hz and -160 dBc/Hz, at 10 Hz. A SPICE characterization of the carrier suppression system is given. An investigation of the phase modulation (PM) noise in 10 MHz BVA, SC-cut quartz crystal resonator pairs is presented.
在本文中，我们将介绍一种新设备，它能够使用具有载波抑制功能的相位桥系统来表征晶体谐振器的相位噪声。该设备可以在无源电路中测量石英晶体谐振器的固有相位稳定性，而不会受到通常与有源振荡器相关的噪声影响。我们在1 Hz时实现了约-150 dBc/Hz的系统本底噪声，在10 Hz时为-160 dBc/Hz。文中给出了载波抑制系统的SPICE特性描述。还对10 MHz BVA、SC切割石英晶体谐振器对中的相位调制（PM）噪声进行了研究。
